{"product_id":"electromigration-in-metals-fundamentals-to-nano-interconnects-hardback-9781107032385","title":"Electromigration in Metals; Fundamentals to Nano-Interconnects (Hardback) 9781107032385","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eElectromigration in Metals\u003c\/font\u003e\u003cbr\u003e\r\n\u003cfont size=\"5\"\u003eFundamentals to Nano-Interconnects\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cem\u003eLearn to assess electromigration reliability and design resilient chips, building from fundamental physics to advanced methodologies.\u003c\/em\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003cp\u003e\u003cfont size=\"4\"\u003ePaul S. Ho (Author), Chao-Kun Hu (Author), Martin Gall (Author), Valeriy Sukharev (Author)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9781107032385, Cambridge University Press\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eHardback, published 12 May 2022\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e430 pages\u003cbr\u003e25 x 17.4 x 2.4 cm, 0.98 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003eLearn to assess electromigration reliability and design more resilient chips in this comprehensive and practical resource. Beginning with fundamental physics and building to advanced methodologies, this book enables the reader to develop highly reliable on-chip wiring stacks and power grids. Through a detailed review on the role of microstructure, interfaces and processing on electromigration reliability, as well as characterisation, testing and analysis, the book follows the development of on-chip interconnects from microscale to nanoscale. Practical modeling methodologies for statistical analysis, from simple 1D approximation to complex 3D description, can be used for step-by-step development of reliable on-chip wiring stacks and industrial-grade power\/ground grids. This is an ideal resource for materials scientists and reliability and chip design engineers.\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e1. Introduction to electromigration\u003cbr\u003e 2. Fundamentals of electromigration\u003cbr\u003e 3. Thermal stress characteristics and stress induced void formation in aluminium and copper interconnects\u003cbr\u003e 4. Stress evolution and damage formation in confined metal lines under electric stressing\u003cbr\u003e 5. Electromigration in Cu interconnect structures\u003cbr\u003e 6. Scaling effects on microstructure and resistivity of Cu and Co nanointerconnects\u003cbr\u003e Analysis of electromigration induced stress evolution and voiding in Cu damascene lines with microstructure\u003cbr\u003e 8. Massive scale statistical studies for electromigration\u003cbr\u003e 9. Assessment of electromigration damage in large on-chip power grids. Index.\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Semi-conductors \u0026amp; super-conductors [\u003ca title=\"See our other books on Semi-conductors \u0026amp; super-conductors\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Semi-conductors%20\u0026amp;%20super-conductors%20%5BTJFD5%5D%22\"\u003eTJFD5\u003c\/a\u003e], Electrical engineering [\u003ca title=\"See our other books on Electrical engineering\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Electrical%20engineering%20%5BTHR%5D%22\"\u003eTHR\u003c\/a\u003e], Materials science [\u003ca title=\"See our other books on Materials science\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Materials%20science%20%5BTGM%5D%22\"\u003eTGM\u003c\/a\u003e], Nanotechnology [\u003ca title=\"See our other books on Nanotechnology\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Nanotechnology%20%5BTBN%5D%22\"\u003eTBN\u003c\/a\u003e], Electricity, electromagnetism \u0026amp; magnetism [\u003ca title=\"See our other books on Electricity, electromagnetism \u0026amp; magnetism\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Electricity,%20electromagnetism%20\u0026amp;%20magnetism%20%5BPHK%5D%22\"\u003ePHK\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Cambridge University Press","offers":[{"title":"Default Title","offer_id":46005347844376,"sku":"9781107032385","price":70.59,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/products\/9781107032385i_f5c6ccdb-242f-41be-8902-e368a45df866.jpg?v=1691361391","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/electromigration-in-metals-fundamentals-to-nano-interconnects-hardback-9781107032385","provider":"Freshly Printed Books","version":"1.0","type":"link"}