{"product_id":"electromigration-and-electronic-device-degradation-hardback-9780471584896","title":"Electromigration and Electronic Device Degradation (Hardback) 9780471584896","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eElectromigration and Electronic Device Degradation\u003c\/font\u003e\u003cbr\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003c\/p\u003e\n\u003cp\u003e\u003cfont size=\"4\"\u003eAris Christou (Edited by), A Christou (Author)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9780471584896, Wiley\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eHardback, published 7 February 1994\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e360 pages\u003cbr\u003e24 x 16 x 2 cm, 0.68 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003eAddresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eReliability and Electromigration Degradation of GaAs MicrowaveMonolithic Integrated Circuits (A. Christou).\u003cbr\u003e \u003cbr\u003e Simulation and Computer Models for Electromigration (P.Tang).\u003cbr\u003e \u003cbr\u003e Temperature Dependencies on Electromigration (M. Pecht \u0026amp; P.Lall).\u003cbr\u003e \u003cbr\u003e Electromigration and Related Failure Mechanisms in VLSIMetallizations (A. Christou \u0026amp; M. Peckerar).\u003cbr\u003e \u003cbr\u003e Metallic Electromigration Phenomena (S. Krumbein).\u003cbr\u003e \u003cbr\u003e Theoretical and Experimental Study of Electromigration (J.Zhao).\u003cbr\u003e \u003cbr\u003e GaAs on Silicon Performance and Reliability (P. Panayotatos, etal.).\u003cbr\u003e \u003cbr\u003e Electromigration and Stability of Multilayer Metal-SemiconductorSystems on GaAs (A. Christou).\u003cbr\u003e \u003cbr\u003e Electrothermomigration Theory and Experiments in Aluminum Thin FilmMetallizations (A. Christou).\u003cbr\u003e \u003cbr\u003e Reliable Metallization for VLSI (M. Peckerar).\u003cbr\u003e \u003cbr\u003e Index.\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Electronics \u0026amp; communications engineering [\u003ca title=\"See our other books on Electronics \u0026amp; communications engineering\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Electronics%20\u0026amp;%20communications%20engineering%20%5BTJ%5D%22\"\u003eTJ\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Wiley-Interscience","offers":[{"title":"Brand New","offer_id":52297996239128,"sku":"9780471584896","price":179.76,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/files\/9780471584896.jpg?v=1781730343","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/electromigration-and-electronic-device-degradation-hardback-9780471584896","provider":"Freshly Printed Books","version":"1.0","type":"link"}