{"product_id":"dsp-based-testing-of-analog-and-mixed-signal-circuits-paperback-softback-9780818607851","title":"DSP-Based Testing of Analog and Mixed-Signal Circuits (Paperback \/ softback) 9780818607851","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eDSP-Based Testing of Analog and Mixed-Signal Circuits\u003c\/font\u003e\u003cbr\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003c\/p\u003e\n\u003cp\u003e\u003cfont size=\"4\"\u003eMatthew Mahoney (Author)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9780818607851, Wiley\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003ePaperback \/ softback, published 27 April 1987\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e272 pages\u003cbr\u003e28.2 x 20.9 x 1.4 cm, 0.612 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003eAnswers the commonly asked questions about how digital signal processing-based machines work and what role DSP plays in the process. It shows you how DSP performs in real-test situations and uses mathematical concepts rather than derivations. The text addresses difficult test problems and their solutions resulting from the union of automatic test equipment (ATE) and DSP. The author establishes a philosophy of DSP-based testing describing how to think, how to approach a problem, how to create a solution, and how to determine if it really works properly.\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003ePreface.  \u003cp\u003e\u003cb\u003eChapter 1: Introduction to DSP-Based Testing.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eOverview of Testing.\u003c\/p\u003e \u003cp\u003eEmulation versus Automation.\u003c\/p\u003e \u003cp\u003eInvisible Instruments.\u003c\/p\u003e \u003cp\u003eNumerical Vectors.\u003c\/p\u003e \u003cp\u003eVector Transfer.\u003c\/p\u003e \u003cp\u003eVector and Array Processing Speed.\u003c\/p\u003e \u003cp\u003eProcessor Speed.\u003c\/p\u003e \u003cp\u003eFloating-Point Mathematics.\u003c\/p\u003e \u003cp\u003ePhase-Lock Synchronization.\u003c\/p\u003e \u003cp\u003eRepresentative Digitizer.\u003c\/p\u003e \u003cp\u003eDSP-Based Test Advantages Summarized.\u003c\/p\u003e \u003cp\u003ePrice of Using DSP . . .\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 2: Accuracy and Speed of Emulated Instruments.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eHardware Emulation.\u003c\/p\u003e \u003cp\u003eIntegration versus Filtering for AC Measurements.\u003c\/p\u003e \u003cp\u003eCoherent Measurement.\u003c\/p\u003e \u003cp\u003eUnit Test Period.\u003c\/p\u003e \u003cp\u003eCoherent Filtering.\u003c\/p\u003e \u003cp\u003eCorrelation.\u003c\/p\u003e \u003cp\u003eFourier Voltmeter.\u003c\/p\u003e \u003cp\u003eSoftware Version of the FVM.\u003c\/p\u003e \u003cp\u003eOrthogonal Signals and Fourier Voltmeters.\u003c\/p\u003e \u003cp\u003eDFT and FFT.\u003c\/p\u003e \u003cp\u003eSynthesis.\u003c\/p\u003e \u003cp\u003eFrequency Leakage.\u003c\/p\u003e \u003cp\u003eGraphical Example of FFT Application.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 3: Noncoherent Sampling.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eReconstruction.\u003c\/p\u003e \u003cp\u003eTime and Spectral Vectors.\u003c\/p\u003e \u003cp\u003eImaging and Noncoherent Undersampling.\u003c\/p\u003e \u003cp\u003eHeterodyning and Reconstruction.\u003c\/p\u003e \u003cp\u003eRules of Imaging.\u003c\/p\u003e \u003cp\u003eSampling Rates and Spacing.\u003c\/p\u003e \u003cp\u003eNyquist's Limit.\u003c\/p\u003e \u003cp\u003eUniversal Rule for Noncoherent Sampling.\u003c\/p\u003e \u003cp\u003eSine-X-over-X Distortion and Correction.\u003c\/p\u003e \u003cp\u003eReceiver\/Reconstruction Filtering.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 4: Coherence.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eVector Periodicity.\u003c\/p\u003e \u003cp\u003eAmount of Information in a Vector.\u003c\/p\u003e \u003cp\u003eEffective Sampling Rate.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 5: Multitone Testing.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eMultitone Distortion Measurement.\u003c\/p\u003e \u003cp\u003eMultitone Frequency Measurement.\u003c\/p\u003e \u003cp\u003eMultitone versus Single Tone Applications.\u003c\/p\u003e \u003cp\u003eError Sources and Accuracy.\u003c\/p\u003e \u003cp\u003eEffect of Device Uncertainty on Multitone Tests.\u003c\/p\u003e \u003cp\u003eFactors Affecting Accuracy.\u003c\/p\u003e \u003cp\u003eOut-of-Band Measurement Uncertainty.\u003c\/p\u003e \u003cp\u003eEstimating Multitone Accuracy.\u003c\/p\u003e \u003cp\u003eEstimating Multitone Uncertainty Due to Quantization.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 6: Vector Operations for DSP Testing.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eVector Operations in DSP-Programming.\u003c\/p\u003e \u003cp\u003eProgram Examples.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 7: Event Digitizing.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eExplicit versus Implicit Sampling.\u003c\/p\u003e \u003cp\u003eEvent Digitizer.\u003c\/p\u003e \u003cp\u003eTesting Tape Decks.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 8: Measuring Random Noise.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eEquivalent Input Noise.\u003c\/p\u003e \u003cp\u003eNormalized Spectral Noise Density.\u003c\/p\u003e \u003cp\u003eTypical DSP Procedure.\u003c\/p\u003e \u003cp\u003eInput Resistors.\u003c\/p\u003e \u003cp\u003eCoupling Capacitor.\u003c\/p\u003e \u003cp\u003eNoise Bandwidth.\u003c\/p\u003e \u003cp\u003eAccuracy and Repeatability of Noise Measurements.\u003c\/p\u003e \u003cp\u003eStatistical Sampling versus DSP Sampling.\u003c\/p\u003e \u003cp\u003eEstimating the Repeatability of Local Measurements.\u003c\/p\u003e \u003cp\u003eCautions about Averaging.\u003c\/p\u003e \u003cp\u003eComputing Spectral Power from a Sparsely Sampled Signal.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 9: Introduction to A\/D Testing.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eA\/D versus D\/A Conversion.\u003c\/p\u003e \u003cp\u003eTransfer Maps.\u003c\/p\u003e \u003cp\u003eTransmission Parameters versus Intrinsic Parameters.\u003c\/p\u003e \u003cp\u003eConversion Formats and Types.\u003c\/p\u003e \u003cp\u003eUncertainty and Distortion of the Ideal ADC.\u003c\/p\u003e \u003cp\u003eDAC Transfer Error.\u003c\/p\u003e \u003cp\u003eSuperposition Error.\u003c\/p\u003e \u003cp\u003eAdapting D\/A Parameters to ADC Measurement.\u003c\/p\u003e \u003cp\u003eProbabilistic Estimation of ADC Input Noise.\u003c\/p\u003e \u003cp\u003eDynamic Testing.\u003c\/p\u003e \u003cp\u003eNoise Improvement Figure.\u003c\/p\u003e \u003cp\u003eRandom Voltage Noise.\u003c\/p\u003e \u003cp\u003eInduced Jitter Noise.\u003c\/p\u003e \u003cp\u003eEquivalent Number of Bits.\u003c\/p\u003e \u003cp\u003eIdle Noise and Noise Power Ratio.\u003c\/p\u003e \u003cp\u003eSeparating Quantization Distortion from Noise.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 10: Techniques for Flash Converter Testing.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eLinear Histogram Testing.\u003c\/p\u003e \u003cp\u003eHistograms with Sparkle Codes and Missing Codes.\u003c\/p\u003e \u003cp\u003eObtaining the Transfer Function from the Histogram.\u003c\/p\u003e \u003cp\u003eIntegral Linearity Error from the Transfer Curve.\u003c\/p\u003e \u003cp\u003eILE Directly from DLE: A Fast Method.\u003c\/p\u003e \u003cp\u003eCenterlines for Histogram-Derived ILE.\u003c\/p\u003e \u003cp\u003eIntegral Linearity from Weighted Code Centers.\u003c\/p\u003e \u003cp\u003eMIL-STD Regression Line Approach.\u003c\/p\u003e \u003cp\u003eExtreme Values of Linearity Error.\u003c\/p\u003e \u003cp\u003eDifferential Linearity from Weighted Code Center Information.\u003c\/p\u003e \u003cp\u003eDynamic Testing.\u003c\/p\u003e \u003cp\u003eSinusoidal Histogram Testing.\u003c\/p\u003e \u003cp\u003eUsing the Tally to Find MAT T2.\u003c\/p\u003e \u003cp\u003eErrors with Sinusoidal Histograms.\u003c\/p\u003e \u003cp\u003eSpectral Analysis.\u003c\/p\u003e \u003cp\u003eNoise Measurement.\u003c\/p\u003e \u003cp\u003eNoise Separation.\u003c\/p\u003e \u003cp\u003eProgressive Spectra.\u003c\/p\u003e \u003cp\u003eUnscrambling.\u003c\/p\u003e \u003cp\u003eDifferential Phase (DP).\u003c\/p\u003e \u003cp\u003eDifferential Gain (DG).\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 11: Incremental Models for DSP-Based Testing with Applications to Transient and Flutter Measurement.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eIntroduction.\u003c\/p\u003e \u003cp\u003eLimitations of Vector Processors.\u003c\/p\u003e \u003cp\u003eIncremental Modeling.\u003c\/p\u003e \u003cp\u003eComparison with Continuous Equations.\u003c\/p\u003e \u003cp\u003eRC High Pass Model.\u003c\/p\u003e \u003cp\u003eTime Scaling and Normalization.\u003c\/p\u003e \u003cp\u003eBallistic Peaks.\u003c\/p\u003e \u003cp\u003eBallistic Peak Detection Models.\u003c\/p\u003e \u003cp\u003eGeneralized Approach.\u003c\/p\u003e \u003cp\u003eWow and Flutter Measurement.\u003c\/p\u003e \u003cp\u003eDIN\/IEEE\/ANSI\/Quasi-Peak Detection.\u003c\/p\u003e \u003cp\u003eDIN Frequency Weighting.\u003c\/p\u003e \u003cp\u003eImportance of Phase Response in Peak-Reading Instruments.\u003c\/p\u003e \u003cp\u003eFinite Impulse Response (FIR) Filtering.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 12: CODEC Testing.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003ePulse Code Modulation (PCM) CODEC Channel.\u003c\/p\u003e \u003cp\u003eEncoding Law.\u003c\/p\u003e \u003cp\u003eFive Kinds of Tests.\u003c\/p\u003e \u003cp\u003eFull Channel versus Half Channel.\u003c\/p\u003e \u003cp\u003eNormalized Mu-Law and A-Law Measurement Units.\u003c\/p\u003e \u003cp\u003eReview of Decibel-Based Measurement Units.\u003c\/p\u003e \u003cp\u003eCODEC Performance Tests.\u003c\/p\u003e \u003cp\u003eGain and Loss.\u003c\/p\u003e \u003cp\u003eChoosing the Test Frequency.\u003c\/p\u003e \u003cp\u003eFrequency Distribution.\u003c\/p\u003e \u003cp\u003eIntrinsic versus Extrinsic Error.\u003c\/p\u003e \u003cp\u003eTransmission Parameters.\u003c\/p\u003e \u003cp\u003eHalf Channel Encoder Testing.\u003c\/p\u003e \u003cp\u003eDecoder Testing.\u003c\/p\u003e \u003cp\u003eOther Decoder Performance Tests.\u003c\/p\u003e \u003cp\u003eReferences for CODEC (PCM) Telephone Standards.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 13: Selected Reprints.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eAutomated Measurement of 12- to 16-Bit Converters\u003cbr\u003e \u003ci\u003eM. Mahoney (Proceedings of the 1981 IEEE Test Conference, 1981\u003c\/i\u003e. pages 319-327).\u003c\/p\u003e \u003cp\u003eDSP Measurement of Frequency\u003cbr\u003e \u003ci\u003eE. Rosenfeld (Proceedings of the International Test Conference,\u003c\/i\u003e 1986, pages 981-986).\u003c\/p\u003e \u003cp\u003eDSP Synthesized Signal Source for Analog Testing Stimulus and New Test Method\u003cbr\u003e \u003ci\u003eH. Kitayoshi, S. Sumida. K. Shirakawa, and S. Takeshita (Proceedings of the International Test Conference,\u003c\/i\u003e 1985, pages 825-834).\u003c\/p\u003e \u003cp\u003eAn NBS Calibration Service for A\/D and D\/A Conveners\u003cbr\u003e \u003ci\u003eTM. Souders and D.R. Flach (Proceedings of the 1981 IEEE Test Conference,\u003c\/i\u003e 1981, pages 290-303).\u003c\/p\u003e \u003cp\u003eProduction Testing of PCM (Digital) Audio Circuits\u003cbr\u003e \u003ci\u003eM. Landry (Proceedings of the International Test Conference,\u003c\/i\u003e 1983, pages 767-770).\u003c\/p\u003e \u003cp\u003e\u003cb\u003eChapter 14: Appendix: References\/Bibliography.\u003c\/b\u003e\u003c\/p\u003e\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Electronics \u0026amp; communications engineering [\u003ca title=\"See our other books on Electronics \u0026amp; communications engineering\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Electronics%20\u0026amp;%20communications%20engineering%20%5BTJ%5D%22\"\u003eTJ\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Wiley-IEEE Computer Society Pr","offers":[{"title":"Brand New","offer_id":52410714358040,"sku":"9780818607851","price":74.79,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/files\/9780818607851.jpg?v=1784249821","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/dsp-based-testing-of-analog-and-mixed-signal-circuits-paperback-softback-9780818607851","provider":"Freshly Printed Books","version":"1.0","type":"link"}