{"product_id":"digital-systems-testing-and-testable-design-hardback-9780780310629","title":"Digital Systems Testing and Testable Design (Hardback) 9780780310629","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eDigital Systems Testing and Testable Design\u003c\/font\u003e\u003cbr\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003c\/p\u003e\n\u003cp\u003e\u003cfont size=\"4\"\u003eMiron Abramovici (Author), Melvin A. Breuer (Author), Arthur D. Friedman (Author)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9780780310629, Wiley\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eHardback, published 13 September 1994\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e672 pages\u003cbr\u003e25.8 x 18.6 x 4.2 cm, 1.361 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003eThis updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003ePreface.\u003cbr\u003e \u003cbr\u003e How This Book Was Written.\u003cbr\u003e \u003cbr\u003e Introduction.\u003cbr\u003e \u003cbr\u003e Modeling.\u003cbr\u003e \u003cbr\u003e Logic Simulation.\u003cbr\u003e \u003cbr\u003e Fault Modeling.\u003cbr\u003e \u003cbr\u003e Fault Simulation.\u003cbr\u003e \u003cbr\u003e Testing For Single Stuck Faults.\u003cbr\u003e \u003cbr\u003e Testing For Bridging Faults.\u003cbr\u003e \u003cbr\u003e Functional Testing.\u003cbr\u003e \u003cbr\u003e Design For Testability.\u003cbr\u003e \u003cbr\u003e Compression Techniques.\u003cbr\u003e \u003cbr\u003e Built-In Self-Test.\u003cbr\u003e \u003cbr\u003e Logic-Level Diagnosis.\u003cbr\u003e \u003cbr\u003e Self-Checking Design.\u003cbr\u003e \u003cbr\u003e PLA Testing.\u003cbr\u003e \u003cbr\u003e System-Level Diagnosis.\u003cbr\u003e \u003cbr\u003e Index.\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Electronics \u0026amp; communications engineering [\u003ca title=\"See our other books on Electronics \u0026amp; communications engineering\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Electronics%20\u0026amp;%20communications%20engineering%20%5BTJ%5D%22\"\u003eTJ\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Wiley-IEEE Press","offers":[{"title":"Brand New","offer_id":52407345578264,"sku":"9780780310629","price":119.29,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/files\/9780780310629.jpg?v=1784163941","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/digital-systems-testing-and-testable-design-hardback-9780780310629","provider":"Freshly Printed Books","version":"1.0","type":"link"}