{"product_id":"defects-in-semiconductors-hardback-9780128019351","title":"Defects in Semiconductors (Hardback) 9780128019351","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eDefects in Semiconductors\u003c\/font\u003e\u003cbr\u003e\r\n\r\n\r\n\u003c\/p\u003e\n\u003cp\u003e\u003cem\u003eA reference book in semiconductor physics and engineering, with each chapter reviewing a specific type of semiconductor defect\u003c\/em\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003cp\u003e\u003cfont size=\"4\"\u003eLucia Romano (Volume editor), Vittorio Privitera (Volume editor), Chennupati Jagadish (Volume editor)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9780128019351\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eHardback, published 26 May 2015\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e458 pages\u003cbr\u003e22.9 x 15.1 x 2.8 cm, 0.81 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003e\u003cp\u003eThis volume, number 91 in the \u003ci\u003eSemiconductor and Semimetals\u003c\/i\u003e series, focuses on defects in semiconductors. Defects in semiconductors help to explain several phenomena, from diffusion to getter, and to draw theories on materials' behavior in response to electrical or mechanical fields.\u003c\/p\u003e  \u003cp\u003eThe volume includes chapters focusing specifically on electron and proton irradiation of silicon, point defects in zinc oxide and gallium nitride, ion implantation defects and shallow junctions in silicon and germanium, and much more. It will help support students and scientists in their experimental and theoretical paths.\u003c\/p\u003e\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e\u003col\u003e\n\u003cb\u003e \u003cli\u003eRole of Defects in the Dopant Diffusion in Si\u003c\/li\u003e\u003c\/b\u003e\u003ci\u003e \u003c\/i\u003e\u003cp\u003ePeter Pichler\u003c\/p\u003e\n\u003cb\u003e \u003c\/b\u003e\u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eElectron and Proton Irradiation of Silicon\u003c\/li\u003e \u003ci\u003e \u003c\/i\u003e\u003cp\u003eArne Nylandsted Larsen and Abdelmadjid Mesli\u003c\/p\u003e\n\u003cb\u003e \u003c\/b\u003e\u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eIon Implantation Defects and Shallow Junctions in SI and GE\u003c\/li\u003e \u003ci\u003e \u003c\/i\u003e\u003cp\u003eEnrico Napolitani and Giuliana Impellizzeri\u003c\/p\u003e\n\u003cb\u003e \u003c\/b\u003e\u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eDefective Solid-phase Epitaxial Growth of Si\u003c\/li\u003e \u003ci\u003e \u003c\/i\u003e\u003cp\u003eNicholas G. Rudawski, Aaron G. Lind and Thomas P. Martin\u003c\/p\u003e\n\u003cb\u003e \u003c\/b\u003e\u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eNanoindentation of Silicon and Germanium\u003c\/li\u003e \u003ci\u003e \u003c\/i\u003e\u003cp\u003eMangalampalli S. R. N. Kiran, Bianca Haberl, Jodie E. Bradby and James S. Williams\u003c\/p\u003e\n\u003cb\u003e \u003c\/b\u003e\u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eAnalytical Techniques for Electrically Active Defect Detection\u003c\/li\u003e \u003ci\u003e \u003c\/i\u003e\u003cp\u003eEddy Simoen, Johan Lauwaert and Henk Vrielinck\u003c\/p\u003e\n\u003cb\u003e \u003c\/b\u003e\u003cp\u003e \u003c\/p\u003e\n\u003cli\u003eSurface and Defect States in Semiconductors Investigated by Surface Photovoltage\u003c\/li\u003e \u003ci\u003e \u003c\/i\u003e\u003cp\u003eDaniela Cavalcoli, Beatrice Fraboni and Anna Cavallini\u003c\/p\u003e\n\u003cb\u003e \u003c\/b\u003e\u003cp\u003e \u003c\/p\u003e\n\u003cli\u003ePoint Defects in ZnO\u003c\/li\u003e \u003ci\u003e \u003c\/i\u003e\u003cp\u003eMatthew D. McCluskey\u003c\/p\u003e\n\u003cb\u003e \u003c\/b\u003e\u003cp\u003e \u003c\/p\u003e\n\u003cli\u003ePoint Defects in GaN\u003c\/li\u003e \u003ci\u003e \u003c\/i\u003e\u003cp\u003eMichael A. Reshchikov\u003c\/p\u003e\n\u003cb\u003e \u003c\/b\u003e\u003cp\u003e \u003c\/p\u003e\n\u003cli\u003ePoint Defects in Silicon Carbide\u003ci\u003eNaoya Iwamoto and Bengt G. Svensson\u003c\/i\u003e\n\u003c\/li\u003e\n\u003c\/ol\u003e\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Electronic devices \u0026amp; materials [\u003ca title=\"See our other books on Electronic devices \u0026amp; materials\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Electronic%20devices%20\u0026amp;%20materials%20%5BTJFD%5D%22\"\u003eTJFD\u003c\/a\u003e], Electronics \u0026amp; communications engineering [\u003ca title=\"See our other books on Electronics \u0026amp; communications engineering\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Electronics%20\u0026amp;%20communications%20engineering%20%5BTJ%5D%22\"\u003eTJ\u003c\/a\u003e], Materials science [\u003ca title=\"See our other books on Materials science\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Materials%20science%20%5BTGM%5D%22\"\u003eTGM\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Freshly Printed Books","offers":[{"title":"Default Title","offer_id":46649575342360,"sku":"9780128019351","price":151.98,"currency_code":"GBP","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/products\/9780128019351_2e1fb8e8-6f7b-4be4-b8de-4186902a342d.jpg?v=1694353076","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/defects-in-semiconductors-hardback-9780128019351","provider":"Freshly Printed Books","version":"1.0","type":"link"}