{"product_id":"cmos-electronics-how-it-works-how-it-fails-hardback-9780471476696","title":"CMOS Electronics; How It Works, How It Fails (Hardback) 9780471476696","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eCMOS Electronics\u003c\/font\u003e\u003cbr\u003e\r\n\u003cfont size=\"5\"\u003eHow It Works, How It Fails\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\u003cp\u003e\u003cfont size=\"4\"\u003eJaume Segura (Author), Charles F. Hawkins (Author)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9780471476696, Wiley\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eHardback, published 20 April 2004\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e366 pages, Photos: 21 B\u0026amp;W, 0 Color; Drawings: 275 B\u0026amp;W, 0 Color; Tables: 16 B\u0026amp;W, 0 Color\u003cbr\u003e25.9 x 18.4 x 2.3 cm, 0.776 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cem\u003e\u003cfont size=\"3\"\u003e\"...an essential text for practitioners in the CMOS industry or for students headed there…\" (\u003ci\u003eIEEE Solid-State Circuits Society Newsletter\u003c\/i\u003e, October 2004)\u003c\/font\u003e\u003c\/em\u003e\u003c\/p\u003e\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003eCMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book educates readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes. This book instills the electronic knowledge that affects not just design but other important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and problems.  \u003cp\u003eDesigned specifically for the many non-electronic engineers employed in the semiconductor industry who need to reliably manufacture chips at a high rate in large quantities, this is a practical guide to how CMOS electronics work, how failures occur, and how to diagnose and avoid them.\u003c\/p\u003e \u003cp\u003eKey features:\u003c\/p\u003e \u003cul\u003e \u003cli\u003eBuilds a grasp of the basic electronics of CMOS integrated circuits and then leads the reader further to understand the mechanisms of failure.\u003c\/li\u003e \u003cli\u003eUnique descriptions of circuit failure mechanisms, some found previously only in research papers and others new to this publication.\u003c\/li\u003e \u003cli\u003eTargeted to the CMOS industry (or students headed there) and not a generic introduction to the broader field of electronics.\u003c\/li\u003e \u003cli\u003eExamples, exercises, and problems are provided to support the self-instruction of the reader.\u003c\/li\u003e \u003c\/ul\u003e\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eForeword.  \u003cp\u003ePreface.\u003c\/p\u003e \u003cp\u003e\u003cb\u003ePART I: CMOS FUNDAMENTALS.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e\u003cb\u003e1\u003c\/b\u003e \u003cb\u003eElectrical Circuit Analysis.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e1.1 Introduction.\u003c\/p\u003e \u003cp\u003e1.2 Voltage and Current Laws.\u003c\/p\u003e \u003cp\u003e1.3 Capacitors.\u003c\/p\u003e \u003cp\u003e1.4 Diodes.\u003c\/p\u003e \u003cp\u003e1.5 Summary.\u003c\/p\u003e \u003cp\u003eBibliography.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e2 Semiconductor Physics.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e2.1 Semiconductor Fundamentals.\u003c\/p\u003e \u003cp\u003e2.2 Intrinsic and Extrinsic Semiconductors.\u003c\/p\u003e \u003cp\u003e2.3 Carrier Transport in Semiconductors.\u003c\/p\u003e \u003cp\u003e2.4 The \u003ci\u003epn\u003c\/i\u003e Junction.\u003c\/p\u003e \u003cp\u003e2.5 Biasing the \u003ci\u003epn\u003c\/i\u003e Junction: I–V Characteristics.\u003c\/p\u003e \u003cp\u003e2.6 Parasitics in the Diode.\u003c\/p\u003e \u003cp\u003e2.7 Summary.\u003c\/p\u003e \u003cp\u003eBibliography.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e3 MOSFET Transistors.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e3.1 Principles of Operation: Long-Channel Transistors.\u003c\/p\u003e \u003cp\u003e3.2 Threshold Voltage in MOS Transistors.\u003c\/p\u003e \u003cp\u003e3.3 Parasitic Capacitors in MOS Transistors.\u003c\/p\u003e \u003cp\u003e3.4 Device Scaling: Short-Channel MOS Transistors.\u003c\/p\u003e \u003cp\u003e3.5 Summary.\u003c\/p\u003e \u003cp\u003eReferences.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e4 CMOS Basic Gates.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e4.1 Introduction.\u003c\/p\u003e \u003cp\u003e4.2 The CMOS Inverter.\u003c\/p\u003e \u003cp\u003e4.3 NAND Gates.\u003c\/p\u003e \u003cp\u003e4.4 NOR Gates.\u003c\/p\u003e \u003cp\u003e4.5 CMOS Transmission Gates.\u003c\/p\u003e \u003cp\u003e4.6 Summary.\u003c\/p\u003e \u003cp\u003eBibliography.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e5 CMOS Basic Circuits.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e5.1 Combinational logic.\u003c\/p\u003e \u003cp\u003e5.2 Sequential Logic.\u003c\/p\u003e \u003cp\u003e5.3 Input–Output (I\/O) Circuitry.\u003c\/p\u003e \u003cp\u003e5.4 Summary.\u003c\/p\u003e \u003cp\u003eReferences.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003ePART II FAILURE MODES, DEFECTS, AND TESTING OF CMOS Ics.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e\u003cb\u003e6 Failure Mechanisms in CMOS IC Materials.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e6.1 Introduction.\u003c\/p\u003e \u003cp\u003e6.2 Materials Science of IC Metals.\u003c\/p\u003e \u003cp\u003e6.3 Metal Failure Modes.\u003c\/p\u003e \u003cp\u003e6.4 Oxide Failure Modes.\u003c\/p\u003e \u003cp\u003e6.5 Conclusion.\u003c\/p\u003e \u003cp\u003eAcknowledgments.\u003c\/p\u003e \u003cp\u003eBibliography.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e7 Bridging Defects.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e7.1 Introduction.\u003c\/p\u003e \u003cp\u003e7.2 Bridges in ICs: Critical Resistance and Modeling.\u003c\/p\u003e \u003cp\u003e7.3 Gate Oxide Shorts (GOS).\u003c\/p\u003e \u003cp\u003e7.4 Bridges in Combinational Circuits.\u003c\/p\u003e \u003cp\u003e7.5 Bridges in Sequential Circuits.\u003c\/p\u003e \u003cp\u003e7.6 Bridging Faults and Technology Scaling.\u003c\/p\u003e \u003cp\u003e7.7 Conclusion.\u003c\/p\u003e \u003cp\u003eReferences.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e8 Open Defects.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e8.1 Introduction.\u003c\/p\u003e \u003cp\u003e8.2 Modeling Floating Nodes in ICs.\u003c\/p\u003e \u003cp\u003e8.3 Open Defect Classes.\u003c\/p\u003e \u003cp\u003e8.4 Summary.\u003c\/p\u003e \u003cp\u003eReferences.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e9 Parametric Failures.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e9.1 Introduction.\u003c\/p\u003e \u003cp\u003e9.2 Intrinsic Parametric Failures.\u003c\/p\u003e \u003cp\u003e9.3 Intrinsic Parametric Failure Impact on IC Behavior.\u003c\/p\u003e \u003cp\u003e9.4 Extrinsic Parametric Failure.\u003c\/p\u003e \u003cp\u003e9.5 Conclusion.\u003c\/p\u003e \u003cp\u003eReferences.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003e1\u003c\/b\u003e\u003cb\u003e0 Defect-Based Testing.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e10.1 Introduction.\u003c\/p\u003e \u003cp\u003e10.2 Digital IC Testing: The Basics.\u003c\/p\u003e \u003cp\u003e10.3 Design for Test.\u003c\/p\u003e \u003cp\u003e10.4 Defect-Based Testing (DBT).\u003c\/p\u003e \u003cp\u003e10.5 Testing Nanometer ICs.\u003c\/p\u003e \u003cp\u003e10.6 Conclusions.\u003c\/p\u003e \u003cp\u003eBibliography.\u003c\/p\u003e \u003cp\u003eReferences.\u003c\/p\u003e \u003cp\u003eExercises.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eAppendix A:\u003c\/b\u003e \u003cb\u003eSolutions to Self-Exercises.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003eA.1 Chapter 1.\u003c\/p\u003e \u003cp\u003eA.2 Chapter 3.\u003c\/p\u003e \u003cp\u003eA.3 Chapter 4.\u003c\/p\u003e \u003cp\u003eA.4 Chapter 5.\u003c\/p\u003e \u003cp\u003eA.5 Chapter 6.\u003c\/p\u003e \u003cp\u003eA.6 Chapter 7.\u003c\/p\u003e \u003cp\u003eA.8 Chapter 8.\u003c\/p\u003e \u003cp\u003eA.8 Chapter 10.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eIndex.\u003c\/b\u003e\u003c\/p\u003e \u003cp\u003e\u003cb\u003eAbout the Authors.\u003c\/b\u003e\u003c\/p\u003e\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Electronics \u0026amp; communications engineering [\u003ca title=\"See our other books on Electronics \u0026amp; communications engineering\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Electronics%20\u0026amp;%20communications%20engineering%20%5BTJ%5D%22\"\u003eTJ\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Wiley-IEEE Press","offers":[{"title":"Brand New","offer_id":52293486608664,"sku":"9780471476696","price":99.49,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/files\/9780471476696.jpg?v=1781641854","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/cmos-electronics-how-it-works-how-it-fails-hardback-9780471476696","provider":"Freshly Printed Books","version":"1.0","type":"link"}