{"product_id":"characterization-of-high-tc-materials-and-devices-by-electron-microscopy-paperback-9780521031707","title":"Characterization of High Tc Materials and Devices by Electron Microscopy (Paperback \/ softback) 9780521031707","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eCharacterization of High Tc Materials and Devices by Electron Microscopy\u003c\/font\u003e\u003cbr\u003e\r\n\r\n\r\n\u003c\/p\u003e\n\u003cp\u003e\u003cem\u003eA comprehensive account of the application of electron-based microscopies to the study of high-Tc superconductors.\u003c\/em\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003cp\u003e\u003cfont size=\"4\"\u003eNigel D. Browning (Edited by), Stephen J. Pennycook (Edited by)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9780521031707, Cambridge University Press\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003ePaperback \/ softback, published 23 November 2006\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e408 pages, 267 b\/w illus.  3 tables\u003cbr\u003e24.3 x 16.8 x 2.1 cm, 0.669 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cem\u003e\u003cfont size=\"3\"\u003e'… a useful and nearly comprehensive guide to current work in the subject.' J. P. Davey, Contemporary Physics\u003c\/font\u003e\u003c\/em\u003e\u003c\/p\u003e\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003eThis is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, this compilation provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications. Introductory chapters cover the basics of high-resolution transmission electron microscopy, including a chapter devoted to specimen preparation techniques, and microanalysis by scanning transmission electron microscopy. Ensuing chapters examine identification of superconducting compounds, imaging of superconducting properties by low-temperature scanning electron microscopy, imaging of vortices by electron holography and electronic structure determination by electron energy loss spectroscopy. The use of scanning tunnelling microscopy for exploring surface morphology, growth processes and the mapping of superconducting carrier distributions is discussed. Final chapters consider applications of electron microscopy to the analysis of grain boundaries, thin films and device structures. Detailed references are included.\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eList of contributors\u003cbr\u003e Preface\u003cbr\u003e 1. High-resolution transmission electron microscopy S. Horiuchi and L. He\u003cbr\u003e 2. Holography in the transmission electron microscope A. Tonomura\u003cbr\u003e 3. Microanalysis by scanning transmission electron microscopy L. M. Brown and J. Yuan\u003cbr\u003e 4. Specimen preparation for transmission electron microscopy J. G. Wen\u003cbr\u003e 5. Low-temperature scanning electron microscopy R. P. Huebener\u003cbr\u003e 6. Scanning tunneling microscopy M. E. Hawley\u003cbr\u003e 7. Identification of new superconducting compounds by electron microscopy G. Van Tendeloo and T. Krekels\u003cbr\u003e 8. Valence band electron energy loss spectroscopy (EELS) of oxide superconductors Y. Y. Wang and V. P. Dravid\u003cbr\u003e 9. Investigation of charge distribution in Bi2Sr2CaCu2O8 and YBa2Cu3O7 Y. Zhu\u003cbr\u003e 10. Grain boundaries in high Tc materials: transport properties and structure K. L. Merkle, Y. Gao and B. V. Vuchic\u003cbr\u003e 11. The atomic structure and carrier concentration at grain boundaries in YBa2Cu3O7-d N. D. Browning, M. F. Chisholm and S. J. Pennycook\u003cbr\u003e 12. Microstructures in superconducting YBa2Cu3O7 thin films A. F. Marshall\u003cbr\u003e 13. Investigations on the microstructure of YBa2Cu3O7 thin-film edge Josephson junctions by high-resolution electron microscopy C. L. Jia and K. Urban\u003cbr\u003e 14. Controlling the structure and properties of high Tc thin-film devices E. Olsson.\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Materials science [\u003ca title=\"See our other books on Materials science\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Materials%20science%20%5BTGM%5D%22\"\u003eTGM\u003c\/a\u003e], Condensed matter physics [\u003ca title=\"See our other books on Condensed matter physics\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Condensed%20matter%20physics%20%5Bliquid%20state%20\u0026amp;%20solid%20state%20physics%5D%20%5BPHFC%5D%22\"\u003eliquid state \u0026amp; solid state physics PHFC\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Cambridge University Press","offers":[{"title":"Default Title","offer_id":46006220980504,"sku":"9780521031707","price":40.99,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/products\/9780521031707i_543005c2-a072-4465-b962-ee7f188ca165.jpg?v=1694964997","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/characterization-of-high-tc-materials-and-devices-by-electron-microscopy-paperback-9780521031707","provider":"Freshly Printed Books","version":"1.0","type":"link"}