{"product_id":"built-in-test-for-vlsi-pseudorandom-techniques-hardback-9780471624639","title":"Built In Test for VLSI; Pseudorandom Techniques (Hardback) 9780471624639","description":"\u003cfont face=\"Georgia\"\u003e\r\n\u003cp\u003e\u003cfont size=\"6\"\u003eBuilt In Test for VLSI\u003c\/font\u003e\u003cbr\u003e\r\n\u003cfont size=\"5\"\u003ePseudorandom Techniques\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\u003cp\u003e\u003cfont size=\"4\"\u003ePaul H. Bardell (Author), W. H. McAnney (Author), J. Savir (Author)\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e9780471624639, Wiley\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eHardback, published 2 December 1987\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003e368 pages\u003cbr\u003e24 x 16.4 x 2.3 cm, 0.61 kg\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\r\n\r\n\r\n\u003cp align=\"justify\"\u003e\u003cstrong\u003e\u003cfont size=\"3\"\u003eThis handbook provides ready access to all of the major concepts, techniques, problems, and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. This book opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, revewing by comparison the principles of design for testability of more advanced digital technology. Offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing. Also details random and memory testing and the problems of assessing the efficiency of such tests, and the limitations and practical concerns of built-in testing.\u003c\/font\u003e\u003c\/strong\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eDigital Testing and the Need for Testable Design.\u003cbr\u003e \u003cbr\u003e Principles of Testable Design.\u003cbr\u003e \u003cbr\u003e Pseudorandom Sequence Generators.\u003cbr\u003e \u003cbr\u003e Test Response Compression Techniques.\u003cbr\u003e \u003cbr\u003e Shift-Register Polynomial Division.\u003cbr\u003e \u003cbr\u003e Special-Purpose Shift-Register Circuits.\u003cbr\u003e \u003cbr\u003e Random Pattern Built-In Test.\u003cbr\u003e \u003cbr\u003e Built-In Test Structures.\u003cbr\u003e \u003cbr\u003e Limitations and Other Concerns of Random Pattern Testing.\u003cbr\u003e \u003cbr\u003e Test System Requirements for Built-In Test.\u003cbr\u003e \u003cbr\u003e Appendix.\u003cbr\u003e \u003cbr\u003e References.\u003cbr\u003e \u003cbr\u003e Index.\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\u003cp\u003e\u003cfont size=\"3\"\u003eSubject Areas: Electronics \u0026amp; communications engineering [\u003ca title=\"See our other books on Electronics \u0026amp; communications engineering\" href=\"https:\/\/freshlyprintedbooks.co.uk\/search?q=%22Electronics%20\u0026amp;%20communications%20engineering%20%5BTJ%5D%22\"\u003eTJ\u003c\/a\u003e]\u003c\/font\u003e\u003c\/p\u003e\r\n\r\n\r\n\u003c\/font\u003e","brand":"Wiley-Interscience","offers":[{"title":"Brand New","offer_id":52298017079576,"sku":"9780471624639","price":187.19,"currency_code":"GBP","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0730\/2037\/5320\/files\/9780471624639.jpg?v=1781730981","url":"https:\/\/freshlyprintedbooks.co.uk\/products\/built-in-test-for-vlsi-pseudorandom-techniques-hardback-9780471624639","provider":"Freshly Printed Books","version":"1.0","type":"link"}